Title: |
Thermal Measurement, Modeling & Management Symposium (SEMI-THERM), 2018 34th
|
Abbrev: |
IEEE SEMICONDUCTOR THERMAL MEASUREMENT AND MANAGEMENT SYMPOSIUM |
Abbrev: |
IEEE SYMPOSIUM SEMICONDUCTOR THERMAL MEASUREMENT AND MANAGEMENT |
Alternative: |
Semiconductor Thermal Measurement and Management (SEMI-THERM), IEEE Symposium |
Alternative: |
Annual IEEE Semiconductor Thermal Measurement and Management Symposium |
Alternative: |
Semiconductor Thermal Measurement and Management |
Alternative: |
Thermal Measurement, Modeling & Management Symposium |
ISSN: |
2577-1000 |
CODEN: |
ASTSFA |
Peer-Reviewed:
|
No
|
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Availability: |
IEEE Electronic Library (IEL)
|
|
|
Authentication: |
NTK |