Název: |
Thermal Measurement, Modeling & Management Symposium (SEMI-THERM), 2018 34th
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Zkrácený: |
IEEE SEMICONDUCTOR THERMAL MEASUREMENT AND MANAGEMENT SYMPOSIUM |
Zkrácený: |
IEEE SYMPOSIUM SEMICONDUCTOR THERMAL MEASUREMENT AND MANAGEMENT |
Alternativní: |
Semiconductor Thermal Measurement and Management (SEMI-THERM), IEEE Symposium |
Alternativní: |
Annual IEEE Semiconductor Thermal Measurement and Management Symposium |
Alternativní: |
Semiconductor Thermal Measurement and Management |
Alternativní: |
Thermal Measurement, Modeling & Management Symposium |
ISSN: |
2577-1000 |
CODEN: |
ASTSFA |
Recenzováno:
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Ne
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Dostupnost: |
IEEE Electronic Library (IEL)
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Dostupné pro: |
NTK |