| Název: |
Thermal Measurement, Modeling & Management Symposium (SEMI-THERM), 2018 34th
|
| Zkrácený: |
IEEE SEMICONDUCTOR THERMAL MEASUREMENT AND MANAGEMENT SYMPOSIUM |
| Zkrácený: |
IEEE SYMPOSIUM SEMICONDUCTOR THERMAL MEASUREMENT AND MANAGEMENT |
| Alternativní: |
Semiconductor Thermal Measurement and Management (SEMI-THERM), IEEE Symposium |
| Alternativní: |
Annual IEEE Semiconductor Thermal Measurement and Management Symposium |
| Alternativní: |
Semiconductor Thermal Measurement and Management |
| Alternativní: |
Thermal Measurement, Modeling & Management Symposium |
| ISSN: |
2577-1000 |
| CODEN: |
ASTSFA |
|
Recenzováno:
|
Ne
|
| |
| Dostupnost: |
IEEE Electronic Library (IEL)
|
| |
|
| Dostupné pro: |
NTK |
