| Title: |
Journal of Electronic Testing-Theory and Applications
|
| Abbrev: |
J ELECTRON TEST THEORY APPL |
| Abbrev: |
J ELECTRON TESTING THEORY APP |
| Abbrev: |
J ELECTRON TEST |
| Abbrev: |
J ELEC TEST |
| Abbrev: |
J ELECTRON TEST THEORY APPL JETTA |
| Abbrev: |
JOURNAL OF ELECTRONIC TESTING THEORY AND APPLICATIONS |
| Abbrev: |
JOURNAL OF ELECTRONIC TESTING |
| Abbrev: |
J. ELECTRON. TEST.-THEORY APPL |
| Alternative: |
Journal of Electronics |
| ISSN: |
0923-8174 |
| LCCN: |
95657656 |
| CODEN: |
JTTAER |
|
Peer-Reviewed:
|
Yes
|
| |
| Availability: |
ProQuest Central
|
| |
|
|
|
Available from
1997/02/01
|
|
Most recent
1 year(s)
not available
|
|
| Authentication: |
NTK, ÚOCHB |
| |
| Availability: |
Science Journals
|
| |
|
|
|
Available from
1997/02/01
|
|
Most recent
1 year(s)
not available
|
|
| Authentication: |
ÚOCHB |
| |
| Availability: |
SpringerLink Journals
|
| |
|
|
|
Available from
1997/02/01
volume: 10
issue: 1
|
|
| Authentication: |
NTK, ÚOCHB, VŠCHT |
| |
| Availability: |
Technology Collection
|
| |
|
|
|
Available from
1997/02/01
|
|
Most recent
1 year(s)
not available
|
|
| Authentication: |
ÚOCHB |
