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e-Journal Details
Title: IEEE Design & Test of Computers
Abbrev: IEEE DES TEST COMPUT
Abbrev: IEEE DES T
Abbrev: IEEE DESIGN AND TEST OF COMPUTERS
Abbrev: DESIGN AND TEST OF COMPUTERS, IEEE
Alternative: Design & Test of Computers, IEEE
Alternative: IEEE Design and Test of Computers Magazine
ISSN: 0740-7475
LCCN: 91641150
Peer-Reviewed: Yes
 
Availability: IEEE Electronic Library (IEL)
 
Available from 1984 volume: 1 issue: 1 until (and including) 2012 volume: 29 issue: 6
Authentication: NTK
 
Availability: IEEE Electronic Library (IEL) Journals
 
Available from 1984 volume: 1 issue: 1 until (and including) 2012 volume: 29 issue: 6
Authentication: NTK
 
Categories:
Engineering: Electrical Engineering
Engineering: Electronics
Information Technology: Automation
Information Technology: Computer Science (Hardware & Networks)
 
Journal History:
Continued by: Ieee design & Test [2168-2356]