| Title: |
Thermal Measurement, Modeling & Management Symposium (SEMI-THERM), 2018 34th
|
| Abbrev: |
IEEE SEMICONDUCTOR THERMAL MEASUREMENT AND MANAGEMENT SYMPOSIUM |
| Abbrev: |
IEEE SYMPOSIUM SEMICONDUCTOR THERMAL MEASUREMENT AND MANAGEMENT |
| Alternative: |
Semiconductor Thermal Measurement and Management (SEMI-THERM), IEEE Symposium |
| Alternative: |
Annual IEEE Semiconductor Thermal Measurement and Management Symposium |
| Alternative: |
Semiconductor Thermal Measurement and Management |
| Alternative: |
Thermal Measurement, Modeling & Management Symposium |
| ISSN: |
2577-1000 |
| CODEN: |
ASTSFA |
|
Peer-Reviewed:
|
No
|
| |
| Availability: |
IEEE Electronic Library (IEL)
|
| |
|
| Authentication: |
NTK |
