e-Journal Details
Title:
VLSI Test Symposium
Abbrev:
IEEE VLSI TEST SYMPOSIUM
Alternative:
Proceedings
Alternative:
VLSI Test Symposium
ISSN:
1093-0167
LCCN:
2005262240
Peer-Reviewed:
No
Availability:
IEEE Electronic Library (IEL)
Available from 1991
Authentication:
NTK
Categories:
Engineering: Electrical Engineering
