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Total number of e-Journals: 7074

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Journal title	ISSN	Actions

Relatório Anual do BNDES
Relatório Anual e de Sustentabilidade Eletrobras
Relatório anual / Eletrobrás
Relatório de Actividades e Contas / Instituto Nacional da Propriedade Industrial
Relatório de Atividades / Instituto Nacional da Propriedade Industrial
Relatório de Estabilidade Financeira	1677-812X
Relatório de inflação [View journal history for additional full text]	1517-6576
Relatórios de pesquisa em engenharia de produção	1678-2399
Relatórios Técnicos do DIA/UNIRIO
Relay Protection and Automation (RPA), International Youth Scientific and Technical Conference	2832-1278
Relazione annuale presentata all'Assembela ordinaria dei partecipanti [View journal history for additional full text]	1972-845X
Relazione per l'anno CONSOB
Relc Journal	0033-6882
Release Engineering (RELENG), International Workshop on
Release of offshore petroleum exploration areas Australia
Reliability	1090-3259
Reliability and Maintainability Computer-Aided Engineering in Concurrent Engineering, Workshops on
Reliability engineering [View journal history for additional full text]	0143-8174
Reliability Engineering & System Safety [View journal history for additional full text]	0951-8320
Reliability, Infocom Technologies and Optimization (ICRITO) (Trends and Future Directions), International Conference on
Reliability, Maintainability and Safety,ICRMS, International Conference on	2575-2642
Reliability of Compound Semiconductors (ROCS) Workshop
Reliability of Electron Devices, Failure Physics and Analysis (ESREF), European Symposium on
Reliability, Safety and Hazard (ICRESH), International Conference on
Reliability Science for Advanced Materials and Devices (RSAMD), Conference on
Reliability Symposium, Reliability - Investing in the Future., IEEE Annual Spring
Reliability Systems Engineering (ICRSE), International Conference on
Reliability--theory & applications	1932-2321
Reliable Computing [View journal history for additional full text]	1385-3139
Reliable Distributed Systems (SRDS), 2018 IEEE 37th Symposium on [View journal history for additional full text]	2575-8462

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